Abstract
Fast and high-accuracy deformation analysis using digital image correlation (DIC) has been increasingly important and highly demanded in recent years. In literature, the DIC method using the NewtonRapshon (NR) algorithm has been considered as a gold standard for accurate sub-pixel displacement tracking, as it is insensitive to the relative deformation and rotation of the target subset and thus provides highest sub-pixel registration accuracy and widest applicability. A significant drawback of conventional NR-algorithm-based DIC method, however, is its extremely huge computational expense. In this paper, a fast DIC method is proposed deformation measurement by effectively eliminating the repeating redundant calculations involved in the conventional NR-algorithm-based DIC method. Specifically, a reliability-guided displacement scanning strategy is employed to avoid time-consuming integerpixel displacement searching for each calculation point, and a pre-computed global interpolation coefficient look-up table is utilized to entirely eliminate repetitive interpolation calculation at sub-pixel locations. With these two approaches, the proposed fast DIC method substantially increases the calculation efficiency of the traditional NR-algorithm-based DIC method. The performance of proposed fast DIC method is carefully tested on real experimental images using various calculation parameters. Results reveal that the computational speed of the present fast DIC is about 120200 times faster than that of the traditional method, without any loss of its measurement accuracy
| Original language | English |
|---|---|
| Pages (from-to) | 841-847 |
| Number of pages | 7 |
| Journal | Optics and Lasers in Engineering |
| Volume | 49 |
| Issue number | 7 |
| DOIs | |
| State | Published - Jul 2011 |
Keywords
- Deformation measurement
- Digital image correlation
- Sub-pixel
Fingerprint
Dive into the research topics of 'A fast digital image correlation method for deformation measurement'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver