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A fast and robust convolutional neural network-based defect detection model in product quality control

  • Tian Wang*
  • , Yang Chen
  • , Meina Qiao
  • , Hichem Snoussi
  • *Corresponding author for this work
  • Beihang University
  • Université de technologie de Troyes

Research output: Contribution to journalArticlepeer-review

Abstract

The fast and robust automated quality visual inspection has received increasing attention in the product quality control for production efficiency. To effectively detect defects in products, many methods focus on the hand-crafted optical features. However, these methods tend to only work well under specified conditions and have many requirements for the input. So the work in this paper targets on building a deep model to solve this problem. The elaborately designed deep convolutional neural networks (CNN) proposed by us can automatically extract powerful features with less prior knowledge about the images for defect detection, while at the same time is robust to noise. We experimentally evaluate this CNN model on a benchmark dataset and achieve a fast detection result with a high accuracy, surpassing the state-of-the-art methods.

Original languageEnglish
Pages (from-to)3465-3471
Number of pages7
JournalInternational Journal of Advanced Manufacturing Technology
Volume94
Issue number9-12
DOIs
StatePublished - 1 Feb 2018

Keywords

  • Convolutional neural networks
  • Defect detection
  • Product quality control

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