A descriminant method for consistency of accelerated degradation mechanism based on MC-ApEn

Qiang Chen; Yunxia Chen; Rui Kang

doi:10.1109/PHM.2012.6228820

A descriminant method for consistency of accelerated degradation mechanism based on MC-ApEn

Qiang Chen^*
, Yunxia Chen
, Rui Kang

^*Corresponding author for this work

School of Reliability and Systems Engineering

Beihang University

Research output: Contribution to conference › Paper › peer-review

Abstract

The method of moving cut data-approximate entropy (MC-ApEn) is used in this paper. With the data obtained by an enhancement testing of a certain kind of conductive film resistors, the discriminant method of consistency of accelerated degradation mechanism is presented. Finally, the new judgment method of consistency of accelerated degradation mechanism based on the data of enhancement testing is discussed.

Original language	English
DOIs	https://doi.org/10.1109/PHM.2012.6228820
State	Published - 2012
Event	2012 3rd Annual IEEE Prognostics and System Health Management Conference, PHM-2012 - Beijing, China Duration: 23 May 2012 → 25 May 2012

Conference

Conference	2012 3rd Annual IEEE Prognostics and System Health Management Conference, PHM-2012
Country/Territory	China
City	Beijing
Period	23/05/12 → 25/05/12

Keywords

MC-ApEn
degradation mechanism consistency
enhancement testing

Access to Document

10.1109/PHM.2012.6228820

Cite this

@conference{cd2990c57c7641d9abff7d05512be84b,

title = "A descriminant method for consistency of accelerated degradation mechanism based on MC-ApEn",

abstract = "The method of moving cut data-approximate entropy (MC-ApEn) is used in this paper. With the data obtained by an enhancement testing of a certain kind of conductive film resistors, the discriminant method of consistency of accelerated degradation mechanism is presented. Finally, the new judgment method of consistency of accelerated degradation mechanism based on the data of enhancement testing is discussed.",

keywords = "MC-ApEn, degradation mechanism consistency, enhancement testing",

author = "Qiang Chen and Yunxia Chen and Rui Kang",

year = "2012",

doi = "10.1109/PHM.2012.6228820",

language = "英语",

note = "2012 3rd Annual IEEE Prognostics and System Health Management Conference, PHM-2012 ; Conference date: 23-05-2012 Through 25-05-2012",

}

TY - CONF

T1 - A descriminant method for consistency of accelerated degradation mechanism based on MC-ApEn

AU - Chen, Qiang

AU - Chen, Yunxia

AU - Kang, Rui

PY - 2012

Y1 - 2012

N2 - The method of moving cut data-approximate entropy (MC-ApEn) is used in this paper. With the data obtained by an enhancement testing of a certain kind of conductive film resistors, the discriminant method of consistency of accelerated degradation mechanism is presented. Finally, the new judgment method of consistency of accelerated degradation mechanism based on the data of enhancement testing is discussed.

AB - The method of moving cut data-approximate entropy (MC-ApEn) is used in this paper. With the data obtained by an enhancement testing of a certain kind of conductive film resistors, the discriminant method of consistency of accelerated degradation mechanism is presented. Finally, the new judgment method of consistency of accelerated degradation mechanism based on the data of enhancement testing is discussed.

KW - MC-ApEn

KW - degradation mechanism consistency

KW - enhancement testing

UR - https://www.scopus.com/pages/publications/84866163023

U2 - 10.1109/PHM.2012.6228820

DO - 10.1109/PHM.2012.6228820

M3 - 论文

AN - SCOPUS:84866163023

T2 - 2012 3rd Annual IEEE Prognostics and System Health Management Conference, PHM-2012

Y2 - 23 May 2012 through 25 May 2012

ER -

A descriminant method for consistency of accelerated degradation mechanism based on MC-ApEn

Abstract

Conference

Keywords

Access to Document

Other files and links

Fingerprint

Cite this