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A Cluster-Based Hybrid Feature Selection Method for Defect Prediction

  • Fei Wang
  • , Jun Ai
  • , Zhuoliang Zou
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Machine learning is an effective method for software defect prediction. The performance of learning models can be affected by irrelative and redundant features. Feature selection techniques select a subset of most impactful relevant features that will result in higher accuracy and efficiency of models. This paper proposed a Cluster-based Hybrid Feature Selection method (CHIFS) for software defect prediction. A spectral cluster-based Feature Quality coefficient (FQ) was defined as a comprehensive measurement of feature relevance and redundancy. The final feature subset was iteratively selected from feature sequence ranked by FQ. The proposed CHIFS method was validated in the experiments using 3 classifiers with 15 open datasets from Promise Repository. Experimental results showed that the CHIFS method performed better than traditional methods in terms of accuracy and efficiency on a wide range of datasets.

Original languageEnglish
Title of host publicationProceedings - 19th IEEE International Conference on Software Quality, Reliability and Security, QRS 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-9
Number of pages9
ISBN (Electronic)9781728139272
DOIs
StatePublished - Jul 2019
Event19th IEEE International Conference on Software Quality, Reliability and Security, QRS 2019 - Sofia, Bulgaria
Duration: 22 Jul 201926 Jul 2019

Publication series

NameProceedings - 19th IEEE International Conference on Software Quality, Reliability and Security, QRS 2019

Conference

Conference19th IEEE International Conference on Software Quality, Reliability and Security, QRS 2019
Country/TerritoryBulgaria
CitySofia
Period22/07/1926/07/19

Keywords

  • defect prediction
  • feature selection
  • software network
  • spectral cluster

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