A Bi-bandwidth Extended State Observer for System with Measurement Noise

Lilei Liu; Lingyu Yang; Jing Zhang

doi:10.1109/ICCA51439.2020.9264460

A Bi-bandwidth Extended State Observer for System with Measurement Noise

Lilei Liu
, Lingyu Yang
, Jing Zhang

School of Automation Science and Electrical Engineering

Beihang University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

Although traditional Extended State Observer (ESO) can efficiently estimate the total disturbance of the system theoretically, observation may diverge from the actual system when the measurement noises exist, due to the sensibility of such high-gain-observer to noises. The trade-off between transient property and denoise capacity of ESO considerably complicates the tuning of gain parameters. Taking this into account, we proposed a novel ESO-based approach, the Bi-bandwidth ESO (BESO), which uses direction information of estimation error rate to tune the bandwidth of ESO dynamically. Numerical comparisons among the LESO, NESO, and BESO, are given to demonstrate the effectiveness of our proposed approach for tackling observation issues with measurement noises.

Original language	English
Title of host publication	2020 IEEE 16th International Conference on Control and Automation, ICCA 2020
Publisher	IEEE Computer Society
Pages	1014-1019
Number of pages	6
ISBN (Electronic)	9781728190938
DOIs	https://doi.org/10.1109/ICCA51439.2020.9264460
State	Published - 9 Oct 2020
Event	16th IEEE International Conference on Control and Automation, ICCA 2020 - Virtual, Sapporo, Hokkaido, Japan Duration: 9 Oct 2020 → 11 Oct 2020

Publication series

Name	IEEE International Conference on Control and Automation, ICCA
Volume	2020-October
ISSN (Print)	1948-3449
ISSN (Electronic)	1948-3457

Conference

Conference	16th IEEE International Conference on Control and Automation, ICCA 2020
Country/Territory	Japan
City	Virtual, Sapporo, Hokkaido
Period	9/10/20 → 11/10/20

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10.1109/ICCA51439.2020.9264460

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Liu, L., Yang, L., & Zhang, J. (2020). A Bi-bandwidth Extended State Observer for System with Measurement Noise. In 2020 IEEE 16th International Conference on Control and Automation, ICCA 2020 (pp. 1014-1019). Article 9264460 (IEEE International Conference on Control and Automation, ICCA; Vol. 2020-October). IEEE Computer Society. https://doi.org/10.1109/ICCA51439.2020.9264460

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title = "A Bi-bandwidth Extended State Observer for System with Measurement Noise",

abstract = "Although traditional Extended State Observer (ESO) can efficiently estimate the total disturbance of the system theoretically, observation may diverge from the actual system when the measurement noises exist, due to the sensibility of such high-gain-observer to noises. The trade-off between transient property and denoise capacity of ESO considerably complicates the tuning of gain parameters. Taking this into account, we proposed a novel ESO-based approach, the Bi-bandwidth ESO (BESO), which uses direction information of estimation error rate to tune the bandwidth of ESO dynamically. Numerical comparisons among the LESO, NESO, and BESO, are given to demonstrate the effectiveness of our proposed approach for tackling observation issues with measurement noises.",

author = "Lilei Liu and Lingyu Yang and Jing Zhang",

note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 16th IEEE International Conference on Control and Automation, ICCA 2020 ; Conference date: 09-10-2020 Through 11-10-2020",

year = "2020",

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doi = "10.1109/ICCA51439.2020.9264460",

language = "英语",

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Liu, L, Yang, L & Zhang, J 2020, A Bi-bandwidth Extended State Observer for System with Measurement Noise. in 2020 IEEE 16th International Conference on Control and Automation, ICCA 2020., 9264460, IEEE International Conference on Control and Automation, ICCA, vol. 2020-October, IEEE Computer Society, pp. 1014-1019, 16th IEEE International Conference on Control and Automation, ICCA 2020, Virtual, Sapporo, Hokkaido, Japan, 9/10/20. https://doi.org/10.1109/ICCA51439.2020.9264460

A Bi-bandwidth Extended State Observer for System with Measurement Noise. / Liu, Lilei; Yang, Lingyu ; Zhang, Jing.
2020 IEEE 16th International Conference on Control and Automation, ICCA 2020. IEEE Computer Society, 2020. p. 1014-1019 9264460 (IEEE International Conference on Control and Automation, ICCA; Vol. 2020-October).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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N2 - Although traditional Extended State Observer (ESO) can efficiently estimate the total disturbance of the system theoretically, observation may diverge from the actual system when the measurement noises exist, due to the sensibility of such high-gain-observer to noises. The trade-off between transient property and denoise capacity of ESO considerably complicates the tuning of gain parameters. Taking this into account, we proposed a novel ESO-based approach, the Bi-bandwidth ESO (BESO), which uses direction information of estimation error rate to tune the bandwidth of ESO dynamically. Numerical comparisons among the LESO, NESO, and BESO, are given to demonstrate the effectiveness of our proposed approach for tackling observation issues with measurement noises.

AB - Although traditional Extended State Observer (ESO) can efficiently estimate the total disturbance of the system theoretically, observation may diverge from the actual system when the measurement noises exist, due to the sensibility of such high-gain-observer to noises. The trade-off between transient property and denoise capacity of ESO considerably complicates the tuning of gain parameters. Taking this into account, we proposed a novel ESO-based approach, the Bi-bandwidth ESO (BESO), which uses direction information of estimation error rate to tune the bandwidth of ESO dynamically. Numerical comparisons among the LESO, NESO, and BESO, are given to demonstrate the effectiveness of our proposed approach for tackling observation issues with measurement noises.

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ER -

A Bi-bandwidth Extended State Observer for System with Measurement Noise

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