TY - GEN
T1 - A Bayesian approach for a complex system utilizing imperfect information
AU - Yang, Lechang
AU - Zhang, Jianguo
AU - Wang, Pidong
AU - Guo, Yanling
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/5/8
Y1 - 2015/5/8
N2 - This paper presents a Bayesian-based information aggregation approach addressing two critical issues in modeling hierarchical systems, (i) the information imbalance between adjacent levels in multi-level systems, and (ii) the limitation of utilizing multi-type reliability test data embedded in conventional proposals. The proposed methodology can significantly improve the accuracy of system-level reliability modeling by aggregating information throughout the hierarchical system.
AB - This paper presents a Bayesian-based information aggregation approach addressing two critical issues in modeling hierarchical systems, (i) the information imbalance between adjacent levels in multi-level systems, and (ii) the limitation of utilizing multi-type reliability test data embedded in conventional proposals. The proposed methodology can significantly improve the accuracy of system-level reliability modeling by aggregating information throughout the hierarchical system.
KW - hierarchical structure
KW - information aggregation
KW - multi-level
KW - multi-type test data
UR - https://www.scopus.com/pages/publications/84945396102
U2 - 10.1109/RAMS.2015.7105126
DO - 10.1109/RAMS.2015.7105126
M3 - 会议稿件
AN - SCOPUS:84945396102
T3 - Proceedings - Annual Reliability and Maintainability Symposium
BT - RAMS 2015 - 61st Annual Reliability and Maintainability Symposium, Proceedings and Tutorials 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 61st Annual Reliability and Maintainability Symposium, RAMS 2015
Y2 - 26 January 2015 through 29 January 2015
ER -