TY - GEN
T1 - A 3.3-GHz 101fsrms-Jitter, -250.3dB FOM Fractional-N DPLL with Phase Error Detection Accomplished in Fully Differential Voltage Domain
AU - Wu, Lianbo
AU - Burger, Thomas
AU - Schonle, Philipp
AU - Huang, Qiuting
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/6
Y1 - 2020/6
N2 - This paper presents a Fractional-N (Frac-N) digital phase-locked loop (DPLL) that resolves phase error (PE) in fully differential voltage (FDV) domain, where power-efficient PE detection can be accomplished with higher CMRR, lower PVT sensitivity, finer resolution and better linearity as compared to gate delay-dependent time domain. The implemented DPLL covers the frac-N operation by a 10b DAC in voltage domain (V-domain). A differential dv/dt ramp is employed to linearly transfer the frac-N phase difference into a small range voltage error, which is digitized by a narrow range but fine resolution 7b ADC. The DPLL achieves an integrated RMS jitter of 101fs with -56dBc worst-case fractional spur and consumes 9.2mW which translates to a FoM of -250.3dB.
AB - This paper presents a Fractional-N (Frac-N) digital phase-locked loop (DPLL) that resolves phase error (PE) in fully differential voltage (FDV) domain, where power-efficient PE detection can be accomplished with higher CMRR, lower PVT sensitivity, finer resolution and better linearity as compared to gate delay-dependent time domain. The implemented DPLL covers the frac-N operation by a 10b DAC in voltage domain (V-domain). A differential dv/dt ramp is employed to linearly transfer the frac-N phase difference into a small range voltage error, which is digitized by a narrow range but fine resolution 7b ADC. The DPLL achieves an integrated RMS jitter of 101fs with -56dBc worst-case fractional spur and consumes 9.2mW which translates to a FoM of -250.3dB.
UR - https://www.scopus.com/pages/publications/85090244420
U2 - 10.1109/VLSICircuits18222.2020.9162777
DO - 10.1109/VLSICircuits18222.2020.9162777
M3 - 会议稿件
AN - SCOPUS:85090244420
T3 - IEEE Symposium on VLSI Circuits, Digest of Technical Papers
BT - 2020 IEEE Symposium on VLSI Circuits, VLSI Circuits 2020 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2020 IEEE Symposium on VLSI Circuits, VLSI Circuits 2020
Y2 - 16 June 2020 through 19 June 2020
ER -