Skip to main navigation Skip to search Skip to main content

A 3-D model-based approach for key failures control of multi-layer product

  • Technology Group Corporation

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Traditional failure analysis results are mostly in text/graphics/tabular form, which brings challenges to intuitional and quick reliability design evaluation, and makes it difficult to recognize the complex interrelationships of failures. A 3-D modelbased failure model was proposed. Two types of failure visualization method oriented component and assembly are provided respectively. For a component, spheres along with their colour and radius are introduced to visualize its failures, severity classes and failure probabilities of occurrence levels. As to reflect the combined failure characteristics of an assembly, a mapping model is given to achieve the RGB value, which is used to colour the corresponding assembly cuboid. By the combination of dynamic filtering of hierarchy-related network, a multi-layer interaction model is constructed, where failures and their hierarchical link are described. Being exemplified by a nozzle signal processor, the present studies illustrate how the failures visualization model be established to monitor and locate key failures quickly and exactly.

Original languageEnglish
Title of host publicationProceedings of 2015 the 1st International Conference on Reliability Systems Engineering, ICRSE 2015
EditorsShunong Zhang, Zili Wang
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467385565
DOIs
StatePublished - 24 Dec 2015
Event1st International Conference on Reliability Systems Engineering, ICRSE 2015 - Beijing, China
Duration: 21 Oct 201523 Oct 2015

Publication series

NameProceedings of 2015 the 1st International Conference on Reliability Systems Engineering, ICRSE 2015

Conference

Conference1st International Conference on Reliability Systems Engineering, ICRSE 2015
Country/TerritoryChina
CityBeijing
Period21/10/1523/10/15

Keywords

  • 3-D model
  • failure control
  • multi-layer product
  • visualization

Fingerprint

Dive into the research topics of 'A 3-D model-based approach for key failures control of multi-layer product'. Together they form a unique fingerprint.

Cite this