Abstract
Visual sensing based three dimensional (3D) particle localization in an optical microscope is important for both fundamental studies and practical applications. Compared with the lateral (X and Y) localization, it is more challenging to achieve a high resolution measurement of axial particle location. In this study, we aim to investigate the effect of different factors on axial measurement resolution through an analytical approach. Analytical models were developed to simulate 3D particle imaging in an optical microscope. A radius vector projection method was applied to convert the simulated particle images into radius vectors. With the obtained radius vectors, a term of axial changing rate was proposed to evaluate the measurement resolution of axial particle localization. Experiments were also conducted for comparison with that obtained through simulation. Moreover, with the proposed method, the effects of particle size on measurement resolution were discussed. The results show that the method provides an efficient approach to investigate the resolution of axial particle localization.
| Original language | English |
|---|---|
| Article number | 015402 |
| Journal | Measurement Science and Technology |
| Volume | 28 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jan 2017 |
Keywords
- localization
- micro particles
- micro/nano measurement
- resolution
- visual sensing
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